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Solar Awards Consumables Final DR 2/9/09 15:39 Page 19
SOLAR AWARDS
Consumable Award
Pasan SA
mechanical wiping to self-clean the (99% +) materials that offer thin film
contact region. The single-wire contact technicians greater control and better
CT 801 Cell Tester design is much more efficient than the material utilization in thin film deposition,
usual pump-type contacts in which physical vapour deposition and sputtering
The CT 801 Cell Tester includes in the contact resistances may vary from a few system processing.
same compact architecture a single-flash milliohms to hundred of milliohms and
xenon light source, an automatic sliding necessitating ten or more contacts to Sputtering Materials has invested over
contact frame, a test chuck with statistically lower this effect. In standard, three years of research and development
interchangeable plates to fit any cell the tester is delivered with six contacts in creating a process for casting CIG and
configuration, even cells with back- pairs; four for current and two for voltage. CIGS onto planar and rotatable
contacts like the Sun-Power A-300, a This can be extended up to nine contacts backplates. Casted targets enable a high
calibrated reference cell, and a Panel-PC pairs to match large cells with three level of total material utilization, because
type computer. metallization bands. the increased density, target life and
control are extended as well as the fact
To become a fully featured cell testing In manual operation, the unit is delivered that the targets are reclaimed and reused
unit, it needs to be connected to an with a pedal switch to allow hand-free to make new targets.
external electronic load and flash working. When the cell is roughly
generator, itself included in a 19“ 6U rack. positioned on the chuck, the operator There is a significant difference between
Its single-flash technology gives a actions the pedal switch. An air blowing powder metallurgy targets and casted
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negligible heating on cell junction level, in system will accurately position the cell on CIGS targets; casted target processes
the tenths of a degree range, much lower the chuck, then the contacts move down, can reuse the spent material by
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than continuous-light testers, so the most the flash is fired, the measurement is machining clean material off spent targets
.solar
accurate I/V curve determination can be taken during flash and the contacts move and re-casting it to make new targets.
achieved. Its active light control ensures up automatically. This new innovative casting technology
-pv-management.com
an accurate light level within 1 % during also works with high purity materials such
all flash duration of 4 ms, so there is no The result is then displayed on the as In, InSn, Sn, Zn, Al, SAC, and others.
need for irradiance correction of screen. Cells can be sorted according to The nature of high-density and high-purity
measured values. predetermined classes and results are material lends itself to be cleanly reclaimed
also available in up to 16 classes on a and re-casted into new targets.
A simple ambient temperature probe potential-free interface for signalization or
allows for thermal correction of results, to drive an external cell sorter. On special
Issue IV 2009
ensuring accurate values even in the case demand, programs including statistics
of temperature variations during the day and lot management can be provided. On
Virtual Industries Inc.,
or from day to day. The lamp assembly option, but at the expense of a longer Molded Solar /Wafer tips
includes our patented light-uniformization measurement cycle, shunt resistance can
device to allow less than 1 % ununiformity be measured on dark mode. Otherwise, Virtual Industries Inc., a supplier of
over the tested cell. This is particularly series and shunt resistances values will manual vacuum handling solutions,
important with multicrystalline cells in be approximated from slopes of the I/V introduced in 2008 a line of angled tips
which some zones may be more efficient curve near Voc and Isc. designed for manual handling of solar
than others giving unconsistent results on cells and wafers. The PEEK material
cell testers with bad light uniformity. The selected for the molded solar/wafer tips is
lamp also includes proper filtering to
ensure true Class A spectral distribution.
Sputtering Materials,
an industry standard. This material has
excellent resistance to most chemicals.
The innovative contacts design uses Inc.
single-wires made of special nickel- High-density casted CIG (CuInGa) The no-sloughing carbon renders the
copper alloy. targets tips ESD -safe. These tips handle
temperatures up to 212°F (100°C).
This stainless alloy is delivered in hard, Sputtering Materials, Inc. offers high-
springquality type and combines very low density casted CIG (CuInGa) targets for The 30° angle allows pick-and-place of
resistance as well as good elasticity to thin film deposition in rotatable and planar coin stacked solar cells. There are a
apply pressure on cell to be measured. form factors for thin film solar production. variety of complete kits available that
Contacts disposition allows slight The casted targets offer high-density include the tip and vacuum handle.
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